000 02958Cam#a22004815i#4500
001 INGC-EBK-000094
003 AR-LpUFI
005 20220927105628.0
007 cr nn 008mamaa
008 131022s2014 xxu| s |||| 0|eng d
020 _a9781461479093
024 7 _a10.1007/978-1-4614-7909-3
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
245 1 0 _aBias Temperature Instability for Devices and Circuits
_h[libro electrónico] /
_cedited by Tibor Grasser.
260 1 _aNew York, NY :
_bSpringer New York :
_bImprint: Springer,
_c2014.
300 _axi, 810 p. :
_bil.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction -- Characterization, Experimental Challenges -- Advanced Characterization -- Characterization of Nanoscale Devices -- Statistical Properties/Variability -- Theoretical Understanding -- Possible Defects: Experimental -- Possible Defects: First Principles -- Modeling -- Technological Impact -- Silicon dioxides/SiON -- High-k oxides -- Alternative technologies -- Circuits.
520 _aThis book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability.  Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.  ·         Enables readers to understand and model negative bias temperature instability, with an emphasis on dynamics; ·         Includes coverage of DC vs. AC stress, duty factor dependence and bias dependence; ·         Explains time dependent defect spectroscopy, as a measurement method that operates on nanoscale MOSFETs; ·         Introduces new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior.
650 0 _aEngineering.
_9259622
650 0 _aSemiconductors.
_9259967
650 0 _aQuality control.
_9259696
650 0 _aReliability.
_9259697
650 0 _aIndustrial safety.
_9259698
650 0 _aElectronics.
_9259648
650 0 _aMicroelectronics.
_9259649
650 0 _aElectronic circuits.
_9259798
650 2 4 _aCircuits and Systems.
_9259651
650 2 4 _aInstrumentation.
_9259652
650 2 4 _aRisk.
_9259691
700 1 _aGrasser, Tibor,
_eed.
_9260068
776 0 8 _iPrinted edition:
_z9781461479086
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4614-7909-3
912 _aZDB-2-ENG
929 _aCOM
942 _cEBK
999 _aSKV
_c27522
_d27522