000 02856Cam#a22004695i#4500
001 INGC-EBK-000056
003 AR-LpUFI
005 20220927105609.0
007 cr nn 008mamaa
008 131005s2014 xxu| s |||| 0|eng d
020 _a9781461417613
024 7 _a10.1007/978-1-4614-1761-3
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
100 1 _aBalasinski, Artur.
_9259935
245 1 0 _aDesign for Manufacturability
_h[libro electrónico] : ;
_bFrom 1D to 4D for 90-22 nm Technology Nodes /
_cby Artur Balasinski.
260 1 _aNew York, NY :
_bSpringer New York :
_bImprint: Springer,
_c2014.
300 _aviii, 278 p :
_bil.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aPreface -- Classic DfM: from 2D to 3D -- DfM at 28 nm and Beyond -- New DfM Domain: Stress Effects -- Conclusions and Future Work.
520 _aThis book explains integrated circuit design for manufacturability (DfM) at the product level (packaging, applications) and applies engineering DfM principles to the latest standards of product development at 22 nm technology nodes.  It is a valuable guide for layout designers, packaging engineers and quality engineers, covering DfM development from 1D to 4D, involving IC design flow setup, best practices, links to manufacturing and product definition, for process technologies down to 22 nm node, and product families including memories, logic, system-on-chip and system-in-package. ·         Provides design for manufacturability guidelines on layout techniques for the most advanced, 22 nm  technology nodes; ·         Includes information valuable to layout designers, packaging engineers and quality engineers, working on memories, logic, system-on-chip and system-in-package;  ·         Offers a highly-accessible, single-source reference to information otherwise available only from disparate sources; ·         Helps readers to translate reliability methodology into real design flows.
650 0 _aEngineering.
_9259622
650 0 _aQuality control.
_9259696
650 0 _aReliability.
_9259697
650 0 _aIndustrial safety.
_9259698
650 0 _aElectronics.
_9259648
650 0 _aMicroelectronics.
_9259649
650 0 _aElectronic circuits.
_9259798
650 2 4 _aCircuits and Systems.
_9259651
650 2 4 _aInstrumentation.
_9259652
650 2 4 _aSafety and Risk.
_9259701
776 0 8 _iPrinted edition:
_z9781461417606
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4614-1761-3
912 _aZDB-2-ENG
929 _aCOM
942 _cEBK
999 _aGEB
_c27484
_d27484